发明名称 |
SILICON WAFER AND MANUFACTURE |
摘要 |
PROBLEM TO BE SOLVED: To provide a polycrystalline silicon film mounted silicon wafer having high gettering power and small stress which is given to the silicon wafer. SOLUTION: This silicon wafer, having a polycrystalline silicon film on one main surface, has a multilayer structure formed by laminating a polycrystalline silicon film on x-layer (x indicates an integer number of 2 or higher) having a different orientational (220) component ratio. In this case, the ratio of the orientational (220) component of the first polysrystalline silicon layer which comes in contact with the silicon wafer is larger than the ratio of orientational (220) component of the second to the x-polycrystalline silicon layer which are laminated on the first polycrystalline silicon layer. |
申请公布号 |
JPH09266213(A) |
申请公布日期 |
1997.10.07 |
申请号 |
JP19960099371 |
申请日期 |
1996.03.28 |
申请人 |
SHIN ETSU HANDOTAI CO LTD |
发明人 |
KOBAYASHI NORIHIRO;KOARAI KATSUNORI |
分类号 |
H01L21/322;H01L21/304;H01L29/04;(IPC1-7):H01L21/322 |
主分类号 |
H01L21/322 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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