发明名称 METHOD FOR EVALUATING QUALITY OF TITANIUM NITRIDE FILM AND APPARATUS THEREFOR
摘要 PROBLEM TO BE SOLVED: To evaluate the quality of a titanaium nitride film by irradiating the titanium nitride film formed on an article with high brightness light and measuring the chromaticity of reflected light. SOLUTION: The film coating surface of a titanium nitride film coated article S, supported on a holder 2 is irradiated with light of which the luminous intensity is several 1000-several 10000 lux or slightly larger than this intensity from the diffusion lens 12 of a high brightness light source and the chromaticity of reflected light is measured by a chromaticity meter 3 to measure the chromaticity of the titanium nitride film. Then, the titanium nitride film of the article S is evaluated on the basis of the preliminarily known correlation between the quality (hardness, crystal state, compsn. or specific resistance) of the titanium nitride film measured by a known method and the measured quality. Since the film quality can be evaluated by directly measuring the chromaticity of the film of the article S in a non-destructive manner, an actual article can be subjected to the evaluation of film quality.
申请公布号 JPH09264786(A) 申请公布日期 1997.10.07
申请号 JP19960075964 申请日期 1996.03.29
申请人 NISSIN ELECTRIC CO LTD 发明人 NAKAHIGASHI TAKAHIRO
分类号 G01J3/50;C01G23/00;C23C14/54;G02B1/11 主分类号 G01J3/50
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