Method and apparatus for parallel testing of memory circuits

摘要

A memory circuit 14 is provided having a data register (20) coupled to the output of the memory cell array (16). The output of the data register (20) may be selectively output, allowing a plurality of memory circuits (14) to be tested in parallel with a substantial increase in efficiency. Furthermore, test data can be written to the memory cell arrays (14) while previous test data is read from the memory circuits for optimum efficiency.