| 摘要 |
PROBLEM TO BE SOLVED: To enable the electric-source current test of a CMOS LSI even to the state of a test pattern in which currents except for an electric-source leakage current flow. SOLUTION: A pattern selecting process 102 selects a pattern to perform an electric-source current test. To the selected pattern, a process 103 obtains the internal state of a circuit. A process 104, with a data base which sets the current value flowing in every internal state of every type of function blocks obtained in advance, obtains both a current flowing in each function block inside of the circuit and the total current value. A process 105 which calculates the limit current for a tester from the above-obtained current value. An electric- source current test process 106 is performed on the basis of this current value. Therefore an electric-source current test can be performed to the state of a test pattern in which a relatively large current flows. |
