| 摘要 |
The invention concerns a device for measuring the thickness and/or unevenness of wadding or non-wovens. The device has a guide element (30) for the wadding or non-wovens and a thickness sensor (26, 27, 28) which presses the wadding or non-wovens against the guide element and can move relative to the latter, the position of the sensor providing a measure of the thickness and/or unevenness of the wadding or non-wovens. To achieve a simpler and cheaper design without sacrificing measurement accuracy, an individual sensor is provided with a translation element (31) which converts the deflections of the individual sensor in one direction into a path signal available in another direction. This allows signals corresponding to the deflections of several individual sensors to be added together and applied to a single common path measurement system (32). |
