发明名称 Analog to digital converter and comparator circuit therefor
摘要 <p>An ADC (18) including a comparator (40) sets, bit-by-bit, a successive approximation binary register (42). Feedback means (42, 44, 48) for auto-biasing, auto calibration, and offset compensation within the ADC (18) are provided. The ADC (18) sets itself to a high degree of accuracy automatically by reference to a master voltage reference. A number of identical ADCs (18) are connected in parallel to provide an increased sampling rate. The ADC (18) architecture compensates for component tolerance differences, for common mode noise, and for secondary parasitic effects. The ADC (18) operates with high resolution at high speed (e.g. 10 bits at 50 MHz), and can be implemented in MOS technology with good integrated circuit chip yield and is compatible with new ASICs. &lt;IMAGE&gt;</p>
申请公布号 EP0798864(A1) 申请公布日期 1997.10.01
申请号 EP19970201485 申请日期 1991.07.02
申请人 SARNOFF CORPORATION 发明人 SAUER, DONALD JON
分类号 H03K5/08;H03K5/24;H03M1/08;H03M1/10;H03M1/12;H03M1/38;H03M1/46;H03M1/68;(IPC1-7):H03M1/38;H03K3/289;H03M1/06 主分类号 H03K5/08
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