发明名称 |
High-voltage-resistant MOS transistor, and corresponding manufacturing process |
摘要 |
A MOS transistor (1) capable of withstanding relatively high voltages is of a type integrated on a region (3) included in a substrate of semiconductor material, having conductivity of a first type (N) and comprising a channel region (7) intermediate between a first active region of source (4) and a second active region of drain (5). Both these regions (4 and 5) have conductivity of a second type (P) and extend from a first surface (6) of the substrate. The transistor (1) also has a gate which comprises at least a first polysilicon layer (8) overlying the first surface (6) at at least said channel region (7), to which it is coupled capacitively through a gate oxide layer (9). According to the invention, the first polysilicon layer (8) includes a mid-portion (13) which only overlies said channel region (7) and has a first total conductivity (C1) of said first type (N), and a peripheral portion (14) with a second total conductivity (C2) differentiated from said first total conductivity (C1), which peripheral portion partly overlies said source and drain active regions (4 and 5) toward said channel region (7). <IMAGE> |
申请公布号 |
EP0798785(A1) |
申请公布日期 |
1997.10.01 |
申请号 |
EP19960830175 |
申请日期 |
1996.03.29 |
申请人 |
STMICROELECTRONICS S.R.L. |
发明人 |
FRATIN, LORENZO;RIVA, CARLO |
分类号 |
H01L21/28;H01L21/336;H01L29/49;H01L29/78 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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