| 摘要 |
A high speed pattern generator is disclosed that can generate a test pattern at high speed for an electronics device to be tested, such as a flash memory where the test flow varies depending on the test results. The pattern generator includes an address generator for generating address data of the test pattern and the address generator has a pipeline wherein a plurality of instructions are executed in sequential stages at the same time, an operation control memory that stores part of the instructions to be processed in the address generator, a save register that stores branch destination data in a sequence control section in response to a match signal from a comparator wherein the sequence control section accesses the operation control memory to read the instructions, and an inhibit gate that prevents an initial clock generator from generating an initial clock for driving the pipeline in the address generator in response to the match signal. |
