发明名称 Resin pellet age determination with treatment and exposure to deformation force for semiconductor production
摘要 The method includes the first step of preheating treatment of the resin pellet (14), then exposing the treated pellet to a deformation force for a predetermined time duration. The deformation is then measured after the expiry of the predetermined time. The measured deformation of the pellet is compared with a predetermined expected deformation, determined as a function of the age of the resin in such a manner that the age of the pellet is determined.
申请公布号 DE19707483(A1) 申请公布日期 1997.09.25
申请号 DE1997107483 申请日期 1997.02.25
申请人 MITSUBISHI SEMICONDUCTOR AMERICA, INC., DURHAM, US 发明人 PALCISKO, WILLIAM M., DURHAM, N.C., US
分类号 G01N3/08;G01N3/14;G01N33/44;(IPC1-7):G01N17/00;G01N1/44 主分类号 G01N3/08
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