发明名称 |
Resin pellet age determination with treatment and exposure to deformation force for semiconductor production |
摘要 |
The method includes the first step of preheating treatment of the resin pellet (14), then exposing the treated pellet to a deformation force for a predetermined time duration. The deformation is then measured after the expiry of the predetermined time. The measured deformation of the pellet is compared with a predetermined expected deformation, determined as a function of the age of the resin in such a manner that the age of the pellet is determined.
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申请公布号 |
DE19707483(A1) |
申请公布日期 |
1997.09.25 |
申请号 |
DE1997107483 |
申请日期 |
1997.02.25 |
申请人 |
MITSUBISHI SEMICONDUCTOR AMERICA, INC., DURHAM, US |
发明人 |
PALCISKO, WILLIAM M., DURHAM, N.C., US |
分类号 |
G01N3/08;G01N3/14;G01N33/44;(IPC1-7):G01N17/00;G01N1/44 |
主分类号 |
G01N3/08 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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