| 摘要 |
PROBLEM TO BE SOLVED: To judge the effect of a defect on a material, whose flaw is to be detected, accurately regardless of the production of noises. SOLUTION: A CPU 61 performs the binary coding of the twodimensional flaw image in a frame memory 62 and stores. the binary coded image in an image memory 63. A defect-shape measuring part 64 obtains the length, width and area of the respective binary coded image in the binary coded images stored in the image memory 63. A defect detecting part 66 judges that the image in the specified dimensional image is the binary coded image (Kp2 ) caused by the defect and specifies the position. A defect-concentration measuring part 65 obtains the gradation value of an image (Kp ) caused by the defect in the frame memory 62. A defect judging part 67 obtains the characteristic quantities such as the length of the defect, the average gradation value of the defect image, the maximum gradation value in the defect image and the total gradation image of the defect images, compares the characteristic quantities and the threshold values in accordance with the preset judging logic and judges the deterious degree of the defect, based on the result of the comparison. |
