发明名称 APPARATUS FOR INSPECTING FOREIGN MATTER
摘要 <p>PROBLEM TO BE SOLVED: To obtain an apparatus for inspecting a foreign matter in which the external leakage of scattered radioactive rays can be reduced even without providing a. lead-filled rubber in the opening of a radiation shield and the cleaning of conveying means for conveying a material to be inspected is facilitated. SOLUTION: The primary scattering point generated when a material 10 to be inspected is irradiated with X rays is collided with the vicinity of the lower end of the upper edge of an opening at the extension line of a straight line for connecting the part for crossing the oblique surface 11a and horizontal surface 11a of a second conveyor 11 to the end side of a first conveyor 12, and a material 10 to be inspected can be passed between the conveyor 11 and the opening of the radiation shielding means 21 and between the oblique surface of the conveyor 12 and the opening of third radiation shielding means 21.</p>
申请公布号 JPH09250992(A) 申请公布日期 1997.09.22
申请号 JP19960057715 申请日期 1996.03.14
申请人 TOSHIBA FA SYST ENG KK 发明人 FUJII MASAJI;UYAMA KIICHIRO;YOSHIDA MASAYA;SASAKI KAZUO
分类号 G01N23/04;G01T7/00;G01V5/00;(IPC1-7):G01N23/04 主分类号 G01N23/04
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