发明名称 ION DETECTING SYSTEM
摘要 PROBLEM TO BE SOLVED: To analyze the main component and the trace amount of component by one time sample introduction. SOLUTION: When necessary conditions such as the element to be analyzed and analyzing method are set from an input unit 21, a controller 19 connects switches 6, 12, 13 as indicated by solid lines when the element set with the analysis by a pulse detection type is analyzed. When a counted value is stored in a register 11, it is fetched and processed. The switches 6, 12, 13 are connected as indicated by broken lines when the element set by the analysis by an analog detection type is analyzed, data is fetched from an A/D converter 18 and processed.
申请公布号 JPH09251079(A) 申请公布日期 1997.09.22
申请号 JP19960057680 申请日期 1996.03.14
申请人 JEOL LTD 发明人 OTSUKA KIICHIRO
分类号 G01N27/62;G01T1/17;G01T1/28;H01J49/26;(IPC1-7):G01T1/17 主分类号 G01N27/62
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