发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To easily form a tapered contact hole. SOLUTION: As the first layer of a layer insulating film 115, a nitride carbide film 115a is film-formed by 500Åby a plasma CVD method. As the second and the third layers, an oxide carbide film is film-formed with TEOS gas as material by a plasma CVD method. At that time, for the second layer, an oxide carbide film 115b is film-formed by 5000Åwith rf output of 300W, and for the third layer, an oxide carbide film 115c is film-formed by 1000Åwith rf output of 50W. The layer insulating film 115 in the mulit-layered structure and a minute positive pole oxide 108 formed around a gate electrode are etched respectively, so that the contact hole of the gate electrode is formed into a tapered shape.
申请公布号 JPH09251996(A) 申请公布日期 1997.09.22
申请号 JP19960181297 申请日期 1996.06.20
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 UOJI HIDEKI;HAYAKAWA MASAHIKO;SAKAMA MITSUNORI;KONUMA TOSHIMITSU;YAMAZAKI SHUNPEI
分类号 C23C16/50;H01L21/28;H01L21/302;H01L21/3065;H01L21/316;H01L21/336;H01L21/768;H01L29/786;(IPC1-7):H01L21/316;H01L21/306 主分类号 C23C16/50
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