发明名称 THIN FILM FORMATION, SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 PROBLEM TO BE SOLVED: To accumulate stable ruthenium films and ruthenium oxide films by means of a chemical gaseous growth method using Ru(DMHPD)3 as a raw material so as to form a ruthenium film or a ruthenium oxide film. SOLUTION: A ruthenium film or a ruthenium oxide film is formed by a chemical gaseous growth method using 2,6-dimethyl-3,5-heptanedione ruthenium (Ru(DMHPD)3 ) as a raw material. For instance, after pressure reduction of the inside of a film-forming chamber 10 a substrate 14 heaping ruthenium films is heated by a lamp heater 17, a prescribed flow of Ar gas of a carrier has is made to flow for being introduced into a film-forming chamber 10 together with Ru(DMHPD)3 . Ru(DMHPD)3 is liquefied by heating a raw material container 24 followed by evaporation. Simultaneously with introduction of Ru(DMHPD)3 , H2 gas is introduced into the film-forming chamber 10 from a gas supplying piping 18 so as to react Ru(DMHPD)3 with H2 gas on the substrate 14 so as to heap the ruthenium film on the substrate 14.
申请公布号 JPH09246214(A) 申请公布日期 1997.09.19
申请号 JP19960047661 申请日期 1996.03.05
申请人 FUJITSU LTD 发明人 NAKABAYASHI MASAAKI
分类号 C01G55/00;C23C16/18;C23C16/40;C30B25/02;C30B29/02;C30B29/16;H01L21/28;H01L21/285;H01L21/314;H01L21/3205;H01L21/8242;H01L21/8246;H01L23/52;H01L27/105;H01L27/108 主分类号 C01G55/00
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