发明名称 SYSTEM FOR ANALYZING CONTACT STRESS
摘要 PROBLEM TO BE SOLVED: To efficiently analyze a contact stress by dividing a structure to partial areas so that two confronting contact faces are in one partial area and data of each contact face required when a contact state of the contact face is to be corrected and calculated are on a memory device of one operational device. SOLUTION: In a process of analyzing a contact, if objects in contact with each other are allotted to different partial areas, i.e., different operational devices 6, it is necessary to transmit data between respective memory devices 7 of the operational devices 6 to estimate a contact state after a load is impressed. As such, the objects in contact with each other are allotted to the same memory device 7, thus eliminating the transmission of data between the memory devices 7. In a calculating process, at each initial stage of repetitions carried out until a surface force is balanced between the partial areas, the contact state analyzed immediately before is set as an initial value. Accordingly, the repeating number of times to calculate the contact is reduced.
申请公布号 JPH09243473(A) 申请公布日期 1997.09.19
申请号 JP19960052882 申请日期 1996.03.11
申请人 HITACHI LTD 发明人 EZAWA YOSHITAKA;SATAKE TAKAHIRO
分类号 G01L1/00;G06F17/00;G06F19/00;G06Q50/00;G06Q50/08 主分类号 G01L1/00
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