发明名称 POLISHING METHOD/DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent the deviation of a polished object such as a semiconductor and to improve polishing uniformity on the polished face of the polished object. SOLUTION: A polishing disk 3 having a polishing pad 4 on a surface 3a and rotated at the time of polishing, a wafer carrier provided with a pressing face 6b for pressing the back 1c of the semiconductor wafer 1, a guide ring 5 which is provided with an inner peripheral face 5a for guiding the outer peripheral part 1b of the semiconductor wafer 1 and forms a wafer storage space 14 constituted of the pressing face 6b of a wafer carrier 6 and the inner peripheral face 5a by making the ring fit to the wafer carrier 6, a polishing disk rotation means for rotating the polishing disk 3 and a carrier rotation means for rotating the wafer carrier 6 are provided. The depth 14a of the wafer storage space 4 is almost equal or deeper to/than the thickness 1d of the semiconductor wafer 1. At the time of polishing the semiconductor wafer 1, the end face 5e of the guide ring 5 and the polished face 1a of the semiconductor wafer 1 form the almost same face.
申请公布号 JPH09246218(A) 申请公布日期 1997.09.19
申请号 JP19960049395 申请日期 1996.03.07
申请人 HITACHI LTD 发明人 ITO HIDEFUMI;MITANI SHINICHIRO;KIMURA TAKESHI;KOJIMA HIROYUKI
分类号 B24B37/00;B24B37/04;B24B37/30;B24B37/32;B24B53/017;H01L21/304 主分类号 B24B37/00
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