| 摘要 |
PROBLEM TO BE SOLVED: To provide a test circuit in which a high frequency test can be performed by use of an inexpensive general-purpose tester. SOLUTION: In a test circuit with built-in LSI for performing the test of a main circuit 1 operating by a clock of a higher frequency (f) by use of a tester operated by a clock of a frequency fT, this circuit has a shift resister 2 for reading and transferring a prescribed number of test data to be supplied to the main circuit 1. In a clock generating circuit 3, the first clock group of the frequency fT and the second clock group of the successive frequency (f) are generated on the basis of clocksϕ,ϕT, and a test control signal TEST1. The test data are subjected to a data speed conversion such that they are read into the shift resister 2 by the low speed first clock group and read out by the high speed second clock group, and supplied to the main circuit 1 through a selecting gate circuit 4.
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