发明名称 OBLIQUE ANGLE FLAW DETECTION METHOD AND APPARATUS
摘要 PROBLEM TO BE SOLVED: To reduce the noise at a specific position like the reflected wave from a non-objective while enhancing only the intensity of the reflected wave from an objective and to enhance the relative SN ratio of a detection signal in oblique flaw detection. SOLUTION: Time shift quantity is set corresponding to the relative position of a probe 14 and a flaw 21 so that the phase only of the reflected wave from an object 20 to be inspected is matched with the same phase. The waveform operational processing of the mutual receiving signals at respective positions having this time shift quantity is executed by a waveform data operation part 6 to increase the intensity only of the reflected wave from the object. Since the phases of the receiving signals at the respective positions are different in the reflected wave from a non-objective, the intensity thereof is lowered by this waveform operational processing. By this constitution, the relative SN ratio of a detection signal can be enhanced in oblique angle flaw detection and the minute flaw of a welded part can be detected.
申请公布号 JPH09243608(A) 申请公布日期 1997.09.19
申请号 JP19960051766 申请日期 1996.03.08
申请人 HITACHI LTD;BABCOCK HITACHI KK 发明人 KOGA KAZUNORI;OURA TAKEHIRO;TAKAHASHI FUMINOBU
分类号 G01N29/04;G01N29/07;G01N29/22;G01N29/44;G21C17/003 主分类号 G01N29/04
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