发明名称 Electrode connections for semiconductor devices
摘要 A method for manufacturing a semiconductor device including forming an electrode on a part of a semiconductor substrate, depositing an insulating film on the semiconductor substrate and on the electrode, and forming a contact hole penetrating through the insulating film to expose a part of the electrode; forming a barrier metal layer on the electrode in the contact hole, on the internal side surface of the contact hole, and on the surface of the insulating film; and depositing a metal layer on the barrier metal layer and patterning the metal layer and the barrier metal layer to form a wiring layer wherein the barrier metal layer comprises a metal that does not form an intermetallic material by solid state diffusion with either of the electrode and the metal layer even at elevated temperatures.
申请公布号 GB2279498(B) 申请公布日期 1997.09.17
申请号 GB19930023286 申请日期 1993.11.11
申请人 * MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TOSHIHIKO * SHIGA;RYO * HATTORI;TOMOKI * OKU
分类号 H01L21/28;H01L21/768;H01L23/485;H01L23/522;H01L23/532;H01L29/43;H01L29/45 主分类号 H01L21/28
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