发明名称 Scanning near field optical microscope
摘要 <p>To provide a scanning field optical microscope having a high resolution of less than a wavelength and being able to measure a locally excited luminescence, evanescent light is emitted on the sample surface using laser light source, lens, and prism . Optical waveguide probe comes close to the sample. Evanescent light is scattered, and detected by lens and photodetector. Two dimensional scanning carried out using XY scanning circuit and XY fine displacement element, and three dimensional picturing is carried out by data processing means. <IMAGE></p>
申请公布号 EP0795770(A1) 申请公布日期 1997.09.17
申请号 EP19970301699 申请日期 1997.03.13
申请人 SEIKO INSTRUMENTS INC. 发明人 TOMITA, EISUKE
分类号 G01B11/30;G01N37/00;G01Q60/18;G01Q60/22;(IPC1-7):G02B21/00 主分类号 G01B11/30
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