Fast scan reset for a large area x-ray detector

摘要

A large area solid state x-ray detector employs a plurality of cells arranged in rows and columns composed of photodiodes that are charged, exposed to x-rays which deplete their charge in proportion to the exposure, and then recharged to determine the amount of exposure. Fast scanning of the photodiodes consistent with the reduction of dark current effects is obtained without ghost images by employing a non-imaging scan following the imaging scan. The non-imaging scan employs a greater proportion of each scan duration for charge restoration than the imaging scan. In one embodiment simultaneous non-imaging recharging of the photodiodes is performed to substantially reduce this non-imaging time.