| 摘要 |
A computer-based method is provided for determining whether a semi-conductor device conforms to design requirements. In one embodiment, the method is based on data stored in a design database, and an automatic test equipment ("ATE") datalog. In a further embodiment, the method includes generating a requirements datalog responsive to the design database, generating a standard datalog responsive to the automatic test equipment datalog, and generating a conformance indication responsive to the requirements datalog and the standard datalog.
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