发明名称 X-RAY DIAGNOSTIC APPARATUS
摘要 <p>PROBLEM TO BE SOLVED: To eliminate X-ray beams adversely affecting the formation of images when an electron beam hits a tungsten wire by forming a conductor path using a material with a smaller number of nuclear positive charges than that in tungsten. SOLUTION: This apparatus is so arranged in an area of a target 1 to detect or evaluate the cross section, the position and the orientation of an electron beam flux 5 and provided with at least one conductor path 8. The conductor path 8 is made of a material with a smaller number of nuclear positive charges than that in tungsten. The conductor path 8 is extended in zigzag along the target 1 and profitably made up of a carbon filament. An evaluator 9 connected to the conductor path 8 is operated to form an output signal depending on the cross section, position and/or the orientation of the electron beam flux 5 so that the cross section, the position and the orientation of the electron beam flux 5 meet specified references through a setter 10 based on the output signals of the evaluator 9.</p>
申请公布号 JPH09238930(A) 申请公布日期 1997.09.16
申请号 JP19970047459 申请日期 1997.03.03
申请人 SIEMENS AG 发明人 EERITSUHI HERU;GUSUTAFUUAADORUFU FUOSU
分类号 A61B6/00;A61B6/03;G01N23/04;G01T1/29;G03B42/02;H01J35/02;H01J35/14;H05G2/00;(IPC1-7):A61B6/00 主分类号 A61B6/00
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