发明名称 Method for fabricating multilayer semiconductor device
摘要 A method for fabricating a multilayer semiconductor device according to the invention includes the steps of providing a conductive layer on a substrate; forming a barrier layer on the first conductive layer; forming an insulation layer on the barrier layer; selectively etching the insulation layer using the barrier layer as a stopper to form a through-hole; and selectively removing the barrier layer at the bottom of the through-hole from the conductive layer.
申请公布号 US5668053(A) 申请公布日期 1997.09.16
申请号 US19940364316 申请日期 1994.12.27
申请人 NEC CORPORATION 发明人 AKIMOTO, TAKESHI
分类号 H01L21/28;H01L21/3213;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/28
代理机构 代理人
主权项
地址