Semiconductor component testing system

摘要

The testing system uses a holding and contacting device (2), for mechanically supporting the component to be tested and providing an electrical contact with each of its electrical terminals, with selective connection of the holding and contacting device to one of a number of different testing devices (5a,5b,...5n). The testing is effected with the selected testing device, with switching over to each of the other testing devices in turn, for effecting a full testing sequence for a wide number of different component parameters.