发明名称 Fast acting FET test circuit for SIR diagnostics
摘要 The firing circuit of an inflatable restraint system is tested to verify operation of two FETs in series with a squib which are used to apply current to the squib. For the test the squib is biased to an intermediate voltage and each FET is turned on alone to apply battery or ground voltage to the squib. High and low voltage detectors sense the voltage excursion past respective thresholds to verify FET operation, and a logic circuit immediately turns off the FET to result in a very short FET on time. If a short is present before the FET is commanded on, a detector and the logic circuit prevents FET conduction to avoid firing or degrading the squib.
申请公布号 US5666065(A) 申请公布日期 1997.09.09
申请号 US19960651073 申请日期 1996.05.22
申请人 DELCO ELECTRONICS CORP. 发明人 RAVAS, RICHARD JOSEPH;ANDERSON, TERRELL;CONSTABLE, ROBERT KEITH
分类号 G01M17/007;G01R31/28;(IPC1-7):G01R31/28;B60Q1/00;G01M19/00 主分类号 G01M17/007
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