Built-in self test for analog to digital converters,申请号HK19970001184-传众专利搜索

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发明名称	Built-in self test for analog to digital converters
摘要
申请公布号	HK118497(A)	申请公布日期	1997.09.05
申请号	HK19970001184	申请日期	1997.06.26
申请人	AT&T CORP.	发明人	DEWITT, MICHAEL R.;CROSS, GEORGE F., JR.;R. RAMACHANDRAN
分类号	G01R31/3185;H03M1/10;H03M1/12;(IPC1-7):H03M1/10	主分类号	G01R31/3185
代理机构		代理人
主权项
地址

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