发明名称 |
STANDARD SAMPLE VESSEL FOR MEASURING THICKNESS OF COATINGS |
摘要 |
PURPOSE:To make possible easy preparation of a highly reliable working curve by making the recess of a base plate in such a shape that can be easily and highly accurately worked and making possible prior measurement of the spacing between this recess and a face plate. |
申请公布号 |
JPS52125352(A) |
申请公布日期 |
1977.10.21 |
申请号 |
JP19760041689 |
申请日期 |
1976.04.13 |
申请人 |
SEIKO INSTR & ELECTRONICS |
发明人 |
HIRAYAMA TAKEKATSU;OKA SANENORI;ISHIJIMA HIROSHI |
分类号 |
G01B15/02;G01B15/00;G01N23/06 |
主分类号 |
G01B15/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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