发明名称 STANDARD SAMPLE VESSEL FOR MEASURING THICKNESS OF COATINGS
摘要 PURPOSE:To make possible easy preparation of a highly reliable working curve by making the recess of a base plate in such a shape that can be easily and highly accurately worked and making possible prior measurement of the spacing between this recess and a face plate.
申请公布号 JPS52125352(A) 申请公布日期 1977.10.21
申请号 JP19760041689 申请日期 1976.04.13
申请人 SEIKO INSTR & ELECTRONICS 发明人 HIRAYAMA TAKEKATSU;OKA SANENORI;ISHIJIMA HIROSHI
分类号 G01B15/02;G01B15/00;G01N23/06 主分类号 G01B15/02
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