PHASE ERROR DETECTION METHOD AND PHASE TRACKING LOOP CIRCUIT,申请号JP19960272744-传众专利搜索

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发明名称	PHASE ERROR DETECTION METHOD AND PHASE TRACKING LOOP CIRCUIT
摘要
申请公布号	JPH09233438(A)	申请公布日期	1997.09.05
申请号	JP19960272744	申请日期	1996.10.15
申请人	SAMSUNG ELECTRON CO LTD	发明人	RI MEIKAN
分类号	H04N7/015;H04L27/06;H04L27/38;H04N5/455;(IPC1-7):H04N7/015	主分类号	H04N7/015
代理机构		代理人
主权项
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