| 摘要 |
PROBLEM TO BE SOLVED: To easily and accurately evaluate the reproclucibility of the thin line part of images, to perform application to an image formation device further and to perform target thin line reproduction at all times. SOLUTION: This method is provided with an image surface measurement process A for using an (n)-bit line image G by the repetition of ON/OFF of a 3-bit line (on-off-on) or more as image patterns for evaluation, scanning the image G formed on an image supporting body 1 along the direction of an image width (m) by the light beam Bm of a pitch (p) sufficiently finer than the image width (m), measuring the state of the light beam Bm for respective scanning points and thus measuring the surface position of the image G for the respective scanning points, a cross section profile plotting process B for plotting the cross section profile of the image G based on the measured result and an image evaluation arithmetic operation process C for calculating a maximum height (Imax), a minimum height (Imin) and an M (modulation)=(Imax-Imin)/(Imax+ Imin). |
