发明名称 Automated process for generating boards from defective chips
摘要 An automated process for generating memory systems from a population of memory elements including non-perfect memory elements, the process comprising testing regions within each non-perfect memory element for defective cells and generating a regional testing result for each non-perfect memory element; grouping the memory elements into a plurality of sets based on the regional testing results; and automatically generating a controlling program for a programmable controller for each memory system incorporating at least one of the plurality of sets.
申请公布号 WO9720316(A3) 申请公布日期 1997.09.04
申请号 WO1996IL00171 申请日期 1996.11.28
申请人 FRIEDMAN, YAAKOV;SUTZKEVER, EFIM;COEL, CRAIG, M.;MEMSYS LTD. 发明人 FRIEDMAN, YAAKOV;SCHNEIDER, MARK;SUTZKEVER, EFIM;COEL, CRAIG, M.
分类号 G11C29/00 主分类号 G11C29/00
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