发明名称 POLISHING DEVICE AND METHOD
摘要 PROBLEM TO BE SOLVED: To provide a surface where the irregularity of polishing is little and the in-plane uniformity of flatting is excellent by finely supplying polishing liquid onto the surface of a wafer in the case where a polishing pad rotatingly polishes a workpiece as it reciprocates along the surface of a polished object such as the wafer. SOLUTION: A polishing unit has a table 6 to rotatably hold a wafer 2; a polishing pad 8 which is rotatably held and discharges polishing liquid from a rotation center part; a reciprocating mechanism for relatively reciprocating the rotating polishing pad 8 along the surface of the wafer 2 in the radius direction of the wafer 2; and a rectification plate 21 for turning the polishing liquid discharged from the central part of the polishing pad 8 toward the surface of the wafer 2 in a state where the central part of the polishing pad 8 is off from the wafer 2.
申请公布号 JPH09225815(A) 申请公布日期 1997.09.02
申请号 JP19960028160 申请日期 1996.02.15
申请人 SONY CORP 发明人 SATO HIROSHI
分类号 B24B37/00;B24B37/07;H01L21/304 主分类号 B24B37/00
代理机构 代理人
主权项
地址