发明名称 LINEAR CONDITIONER DEVICE FOR CHEMICAL MECHANICAL POLISHING SYSTEM
摘要 PROBLEM TO BE SOLVED: To optimize the throughput and flatness of polishing and to minimize contamination and destruction of substrate by forming a polishing surface on a polishing pad to be in contact along a linear segment extending to the vicinity of polishing pad from the edge thereof. SOLUTION: In a polishing device 80 a polishing station 100 (100a-100c) and a transfer station 105 are supported to a table top 83. Each polishing station 100 has a platen 110 on which a polishing pad 120 is placed and a pad conditioner 130. Above a mechanical base 82 a carrousel having a carrier head system 160 (160a-160d) is arranged. Every time when a substrate is polished the conditioner 130 moves reciplocally between the center and the outer edge of the pad 120 to thereby sweep a conditioner head 134 to the whole surface of the pad 120, leading to the recycle thereof.
申请公布号 JPH09225811(A) 申请公布日期 1997.09.02
申请号 JP19960322074 申请日期 1996.10.28
申请人 APPLIED MATERIALS INC 发明人 SANNHOU KOA;RICHIYAADO BUI RAFUROSUKI;JIEIMUSU SHII NISUTOROMU;JIYON PURINSU;ARUFURETSUDO EE GOORUDOSUPIIRU;SUTEFUAN JIEI BURUMENKURANTSU;MANUUSHIYAA BIRANGU
分类号 B24B53/017;H01L21/304 主分类号 B24B53/017
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