发明名称 |
LINEAR CONDITIONER DEVICE FOR CHEMICAL MECHANICAL POLISHING SYSTEM |
摘要 |
PROBLEM TO BE SOLVED: To optimize the throughput and flatness of polishing and to minimize contamination and destruction of substrate by forming a polishing surface on a polishing pad to be in contact along a linear segment extending to the vicinity of polishing pad from the edge thereof. SOLUTION: In a polishing device 80 a polishing station 100 (100a-100c) and a transfer station 105 are supported to a table top 83. Each polishing station 100 has a platen 110 on which a polishing pad 120 is placed and a pad conditioner 130. Above a mechanical base 82 a carrousel having a carrier head system 160 (160a-160d) is arranged. Every time when a substrate is polished the conditioner 130 moves reciplocally between the center and the outer edge of the pad 120 to thereby sweep a conditioner head 134 to the whole surface of the pad 120, leading to the recycle thereof. |
申请公布号 |
JPH09225811(A) |
申请公布日期 |
1997.09.02 |
申请号 |
JP19960322074 |
申请日期 |
1996.10.28 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
SANNHOU KOA;RICHIYAADO BUI RAFUROSUKI;JIEIMUSU SHII NISUTOROMU;JIYON PURINSU;ARUFURETSUDO EE GOORUDOSUPIIRU;SUTEFUAN JIEI BURUMENKURANTSU;MANUUSHIYAA BIRANGU |
分类号 |
B24B53/017;H01L21/304 |
主分类号 |
B24B53/017 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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