发明名称 |
Method for forming contact holes in semiconductor device |
摘要 |
A method for forming contact holes in a semiconductor device, involving formation of a ring-shaped pad at a contact region. The ring-shaped pad is used as an etch barrier film upon forming a contact hole. The use of such a ring-shaped pad enables easy formation of a contact hole with a critical dimension. In accordance with this method, it is possible to increase a process margin upon the formation of contact holes for providing contacts with a critical dimension while maintaining an insulation between neighboring conductors.
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申请公布号 |
US5663100(A) |
申请公布日期 |
1997.09.02 |
申请号 |
US19950533543 |
申请日期 |
1995.09.25 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. |
发明人 |
PARK, CHAN KWANG;KOH, YO HWAN;HWANG, SEONG MIN |
分类号 |
H01L21/28;H01L21/768;(IPC1-7):H01L21/44 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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