发明名称 Method of detecting abnormality and abnormality detection system
摘要 A physical quantity which is emitted from a sample to be detected and which changes with the passage of time, is measured at a predetermined time interval, and abnormality of the sample is detected based on the obtained series data. A plurality of first vectors of a suitable dimension are formed from the time series data, the first vectors are advanced in parallel for a suitable period of time to form second vectors, a, deviation is calculated between the second vectors and the first vectors that are formed, the calculated deviation is compared with a preset threshold value, and whether the sample is abnormal or not is determined based upon the result of comparison. <IMAGE>
申请公布号 AU1671697(A) 申请公布日期 1997.09.02
申请号 AU19970016716 申请日期 1997.02.13
申请人 SUMITOMO METAL INDUSTRIES LIMITED 发明人 TAKAYA MIYANO
分类号 G01D1/18 主分类号 G01D1/18
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