发明名称 Method and apparatus for mass analysis of solution sample
摘要 A method in which cutting of small droplets, neutral particles or photons through to a slit provided between a differential pumping portion and a mass analysis portion is combined with slight deflection of ions just before introduction of the ions into the mass analysis portion so that noises are greatly reduced without reduction of signals to thereby improve the signal-to-noise ratio which is an index of detecting sensitivity or lower limit.
申请公布号 US5663560(A) 申请公布日期 1997.09.02
申请号 US19950555192 申请日期 1995.11.08
申请人 HITACHI, LTD. 发明人 SAKAIRI, MINORU;MIMURA, TADAO;TAKADA, YASUAKI;NABESHIMA, TAKAYUKI;KOIZUMI, HIDEAKI
分类号 H01J49/04;H01J49/06;H01J49/40;(IPC1-7):H01J49/06 主分类号 H01J49/04
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