发明名称 Multi-purpose noninterceptive charged particle beam diagnostic device using diffraction radiation and method for its use
摘要 A method and apparatus for detecting diffraction radiation from a charged particle beam in order to measure parameters that characterize the charged particle beam. The charged particle beam passes near one or more edges, apertures, or interfaces between media of different dielectric constants such that the beam is not intercepted. This generates forward diffraction radiation and reflected diffraction radiation at an angle relative to the direction of the beam. The radiation passes through a focusing system and onto a detector which measures a desired parameter.
申请公布号 US5661304(A) 申请公布日期 1997.08.26
申请号 US19960643178 申请日期 1996.05.06
申请人 STI OPTRONICS, INC. 发明人 KIMURA, WAYNE D.;FIORITO, RALPH B.;RULE, DONALD W.
分类号 H01J37/244;(IPC1-7):H01J37/245 主分类号 H01J37/244
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