发明名称 MEASURING APPARATUS FOR PHYSICAL PROPERTY VALUE
摘要 PROBLEM TO BE SOLVED: To provide a measuring apparatus, for a physical property value, by which the physical property value of a material which is easily influenced thermally and electrically can be measured precisely. SOLUTION: A measuring apparatus for a physical property value is composed of heaters 5, 6 which heat a sample, of a plurality of thermocouples 1, 2 which detect the temperature of the sample, of a terminal part 7 which is provided with an electrode to measure the voltage of the sample and of a control and collection part 50 which comprises a controller to control them or the collector of measured data on the temperature and the voltage. A correction part 30 is installed at the control and collection part 50 in such a way that, when a substance is interposed between the sample and the thermocouples or between the sample and the terminal part, a temperature drop amount generated near the substance is derived from the surface area of the substance or from its volume and from the temperature observed by the thermocouples and that a method which corrects the temperature of the sample is changed into a ROM or a program.
申请公布号 JPH09222403(A) 申请公布日期 1997.08.26
申请号 JP19960028947 申请日期 1996.02.16
申请人 HITACHI LTD 发明人 SHIONO OSAMU;HAYASHIBARA MITSUO
分类号 G01D3/028;G01N25/00;G01N25/18;G01N27/04 主分类号 G01D3/028
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