发明名称 CLEANING DEVICE FOR SEMICONDUCTOR WAFER
摘要 <p>PROBLEM TO BE SOLVED: To provide a cleaning device preventing contamination of a wafer surface by a contaminant hitting a wall inside a bowl and being reacted so as to allow stable cleaning in an edge cleaning process of a wafer. SOLUTION: A vacuum chuck 50 adsorbing and rotating a wafer 100 of a semiconductor wafer 100, a cleaning brush 20 for cleaning an edge of the wafer 100, a conveying device 40 for horizontally conveying this cleaning brush 20 are provided in the inside of a bowl 10. The cleaning brush 20 in conveyed by the conveying device 40 to an edge part of a wafer 100 for coming in contact therewith so as to remove a photoresist substance applied on the edge of the wafer 100.</p>
申请公布号 JPH09223664(A) 申请公布日期 1997.08.26
申请号 JP19960128117 申请日期 1996.05.23
申请人 SAMSUNG ELECTRON CO LTD 发明人 CHIYOU TOUKI;KIN TOUHIYON;KIN MASAHIRO;CHIYOU SEIEN
分类号 H01L21/027;A46B9/02;H01L21/304;(IPC1-7):H01L21/027 主分类号 H01L21/027
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