发明名称 X-RAY EXAMINATION APPARATUS WITH X-RAY FILTER
摘要 The X-ray examination apparatus comprises an X-ray filter for locally attenuating the X-ray beam. The X-ray filter includes a plurality of filter elements. The X-ray absorptivity of each filter element is controlled by the amount of X-ray absorbing liquid with which the filter element is filled. The filling of filter elements is controlled by a voltage. The X-ray absorbing liquid contains a suspension of very small X-ray absorbing particles.
申请公布号 WO9730459(A1) 申请公布日期 1997.08.21
申请号 WO1997IB00089 申请日期 1997.02.07
申请人 PHILIPS ELECTRONICS N.V.;PHILIPS PATENTVERWALTUNG GMBH;PHILIPS NORDEN AB 发明人 GEITTNER, PETER, ERNST, ECKART;LINDERS, PETRUS, WILHELMUS, JOHANNES;LYDTIN, HANS-JUERGEN
分类号 G01N23/04;A61B6/00;G21K1/10;G21K3/00;(IPC1-7):G21K3/00 主分类号 G01N23/04
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