发明名称 PLASMA CHAMBER FOR CONTROLLING ION DOSAGE IN ION IMPLANTATION
摘要 An ion source for generating an ion beam of primary ions is disclosed that includes a plasma chamber and magnets positioned therein for separating the primary ions of the plasma from secondary ions within the plasma. An electrode assembly extracts the primary ions through an extractor outlet port of the plasma chamber to form an ion beam, which preferentially is shaped as a ribbon beam. The primary ions are accelerated in the form of a ribbon beam toward the target workpiece for doping the device. The magnets are oriented in the chamber to produce a uniform current density of primary ions parallel to the elongated axis of the ribbon beam.
申请公布号 WO9730464(A1) 申请公布日期 1997.08.21
申请号 WO1997US02558 申请日期 1997.02.14
申请人 EATON CORPORATION 发明人 KING, MICHAEL, C.;BLAKE, JULIAN, G.;ROSE, PETER, H.
分类号 H01J27/14;H01J37/08;H01J37/18;H01J37/30;H01J37/304;H01J37/317;H01L21/00;H01L21/677;H01L21/683;(IPC1-7):H01J37/08 主分类号 H01J27/14
代理机构 代理人
主权项
地址