发明名称 Capped anneal
摘要 Heteroepitaxy of lattice-mismatched semiconductor materials such as GaAs on silicon is accomplished by first growing GaAs (104) on silicon (102), then growing a lattice matched cap of AlxGa1-xAs (106), next annealing out defects with the AlxGa1-xAs cap (106) limiting desorption of gallium, lastly growing further GaAs (110) directly on the cap. The lattice matched cap is also used as an implant anneal cap.
申请公布号 US5659188(A) 申请公布日期 1997.08.19
申请号 US19950475724 申请日期 1995.06.07
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 KAO, YUNG-CHUNG;PLUMTON, DONALD L.
分类号 H01L29/73;H01L21/20;H01L21/203;H01L21/324;H01L21/331;H01L21/338;H01L29/205;H01L29/737;H01L29/812;(IPC1-7):H01L21/20 主分类号 H01L29/73
代理机构 代理人
主权项
地址
您可能感兴趣的专利