发明名称 Method of chamber cleaning in MOCVD application
摘要 The invention is a process for cleaning a chamber after a chemical vapor deposition has been performed therein. A residue formed during the deposition is combined with a reactive species to form a gas containing an organic substance once found in the residue and to form a film on the chamber walls and internal parts. The gas and the film are removed from the chamber. The formation of a polymer byproduct on the chamber walls and other internal parts of the chamber is minimized by the method of the invention.
申请公布号 US5658391(A) 申请公布日期 1997.08.19
申请号 US19950554690 申请日期 1995.11.07
申请人 MICRON TECHNOLOGY, INC. 发明人 BULEY, TODD W.;SANDHU, GURTEJ S.
分类号 C23C16/44;(IPC1-7):B08B3/00 主分类号 C23C16/44
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