发明名称
摘要 A phase-contrast X-ray CT apparatus is provided with an X-ray source (7) for generating an X-ray beam (8), a crystal (9; 21) for generating a diffracted beam (10a) by irradiation with the X-ray beam, an object arranging section provided in the direction of propagation of the diffracted beam so that it is rotatable relative to the diffracted beam, an analyzer crystal (11; 22) for receiving a beam transmitted through the object arranging section to extract only a specified refraction angle component, and a sensor (6) for detecting a beam extracted by the analyzer crystal. <IMAGE>
申请公布号 EP0784202(A3) 申请公布日期 1997.08.13
申请号 EP19960120999 申请日期 1996.12.30
申请人 HITACHI, LTD. 发明人
分类号 A61B6/03;G01N23/04;(IPC1-7):G01N23/04 主分类号 A61B6/03
代理机构 代理人
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