发明名称 TAIYODENCHINOSEIZOHOHO
摘要 The surface of a silicon wafer is exposed periodically through very small openings of an insulation layer provided on the surface. In this state, angular lumps of single-crystal silicon are generated near the opening parts by a selective epitaxial growth and a lateral growth, and are grown until they are collided with each other. The insulation layer is removed through gaps left between the angular lumps, and a resin is embedded in the gaps. After electrode layers are formed on the surfaces of the angular lumps, the surfaces are fastened on a base board via a resin. Then, the angular lumps of single-crystal silicon are separated from the silicon wafer, and reverse electrodes are formed on them.
申请公布号 JP2640389(B2) 申请公布日期 1997.08.13
申请号 JP19900332231 申请日期 1990.11.29
申请人 KYANON KK 发明人 NISHIDA AKYUKI;YAMAGATA KENJI
分类号 H01L27/12;H01L21/02;H01L21/205;H01L31/04;H01L31/18 主分类号 H01L27/12
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