发明名称 Location of pattern in signal
摘要 <p>A method for determining the location of a pattern, when input in isolation, within a representative input signal is provided. The method aligns (s21) the input signal with a signal representative of a plurality of connected patterns, one of which is the same as the pattern within the input signal. The method then determines the location from the results of the aligning step. The location determined using this apparatus can be used to determine (s23) an isolated reference model by extracting features of the input signal from the location found. This isolated reference model can then be used to generate (s25 and s27) a continuous reference model for the pattern, by aligning the isolated reference model with the signals representative of a plurality of connected patterns, one of which is the pattern to be modelled. &lt;IMAGE&gt;</p>
申请公布号 EP0789347(A2) 申请公布日期 1997.08.13
申请号 EP19970300790 申请日期 1997.02.07
申请人 CANON KABUSHIKI KAISHA 发明人 TZIRKEL-HANCOCK
分类号 G10L15/10;G10L15/06;(IPC1-7):G10L3/00 主分类号 G10L15/10
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