发明名称 SUBSTRATE TREATING DEVICE
摘要 <p>PROBLEM TO BE SOLVED: To provide a substrate treating device capable of sufficiently assuring the thermal and mechanical strength of a structural element heated to a temp. approximately equal to the temp. of a substrate to be treated and exhibiting stable functions over a long period of time. SOLUTION: A semiconductor wafer S as the substrate to be treated is supported by a substrate holder 6 of this substrate treating device. This semiconductor wafer S is held at 300 to 1200 deg.C and while the substrate holder 6 is rotated at the number of revolutions of 500per minute, the semiconductor wafer S is subjected to a prescribed treatment by a vapor growth method. The substrate holder 6 is formed of a carbon fiber reinforced composite material consisting essentially of carbon and an SiC layer is formed on its surface.</p>
申请公布号 JPH09209152(A) 申请公布日期 1997.08.12
申请号 JP19960019891 申请日期 1996.02.06
申请人 TOSHIBA CORP 发明人 FUJII OSAMU
分类号 C23C16/44;C23C16/46;H01L21/205;H01L21/285;H01L21/68;H01L21/683;(IPC1-7):C23C16/46 主分类号 C23C16/44
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