发明名称 Device for examining optical waveguides
摘要 PCT No. PCT/FI94/00151 Sec. 371 Date Oct. 20, 1995 Sec. 102(e) Date Oct. 20, 1995 PCT Filed Apr. 21, 1994 PCT Pub. No. WO94/24536 PCT Pub. Date Oct. 27, 1994A device for examining optical waveguides comprises a prism to be positioned on the waveguide to be investigated, an entering point at which incoming light enters the device, and control devices for altering the angle of light directed to the prism from the entering point of incoming light, wherein the control devices include a mirror whereby the projection of the reflecting surface of the mirror in the plane of altering the angle is in the form of an ellipse, a rotatable mirror is placed at the focal point of the ellipse and the corner of the prism is situated at the second focal point of the same ellipse.
申请公布号 US5657117(A) 申请公布日期 1997.08.12
申请号 US19950537771 申请日期 1995.10.20
申请人 KIMMEL, JYRKI 发明人 KIMMEL, JYRKI
分类号 G01M11/00;(IPC1-7):G01N21/00 主分类号 G01M11/00
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