发明名称 End surface-protected frame-supported pellicle for photolithography
摘要 An improvement is proposed for a frame-supported pellicle used for dust-proof protection of a photomask in the photolithographic patterning work in the manufacture of semiconductor devices. In view of the problem that, when a frame-supported pellicle having the other end surface of the frame coated with a pressure-sensitive adhesive and temporarily protected by attaching a releasable protective sheet of a plastic resin prepared by die punching is handled or transported as packaged, subsequent occurrence of dust particles is more or less unavoidable from the rugged die-punched sections, the die-punched peripheries of the protective sheet is subjected to a smoothening treatment by locally dissolving with an organic solvent, by locally melting at a temperature higher than the melting point of the plastic resin or by coating with a coating composition so that the protective sheet is absolutely not responsible for the subsequent formation of dust particles.
申请公布号 US5656342(A) 申请公布日期 1997.08.12
申请号 US19950524539 申请日期 1995.09.07
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 KASHIDA, MEGURU
分类号 G03F1/14;G03F1/62;H01L21/027;(IPC1-7):G03K9/00 主分类号 G03F1/14
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