发明名称 Method for fabricating planarized borophosphosilicate glass films having low anneal temperatures
摘要 An improved method for forming a planar borophosphosilicate glass (BPSG) insulating layer having a reduced thermal budget was achieved. The method involves forming a multilayer BPSG comprised of four layers with different boron and phosphorus concentrations in each layer. The first layer deposited has the conventional doping range, and therefore would require higher reflow temperatures for leveling. By the method of this invention, a second low-doped BPSG buffer layer is deposited and then a heavily doped third BPSG layer is deposited having a lower reflow temperature, and therefore is planarized at a lower temperature. A low-doped fourth cap BPSG layer is used over the third BPSG layer to minimize moisture absorption and unstable crystal formation prior to the reflow anneal.
申请公布号 US5656556(A) 申请公布日期 1997.08.12
申请号 US19960684663 申请日期 1996.07.22
申请人 VANGUARD INTERNATIONAL SEMICONDUCTOR 发明人 YANG, FU-LIANG
分类号 H01L21/3105;(IPC1-7):H01L21/316 主分类号 H01L21/3105
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